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辐射和辐照度测量

进行辐射测量以确定每单位投影面积的辐射强度量[W/m²/sr],并使用透镜系统作为光学元件对漫反射表面(例如OLED或显示面板)进行测量。

辐照度定义入射到物体表面的辐射通量,通常以每单位表面的功率[W/m²]表示。辐照度测量一般使用配备有余弦校正器和预定义漫反射测量表面的光谱仪进行。这些器件能够显示光谱功率分布,同时显示一些参数,如颜色,CCT,CRI,主波长和峰值波长,PAR值,照度和发光强度。大功率和高功率光源的辐照度也可以通过连接到积分球装置的光谱仪进行测量。

Admesy提供完整的解决方案,用于对各种类型的光源(例如LED或白炽灯)进行辐照度测量。下表显示了适用于辐射和辐照度测量的Admesy光谱仪的概述,包括其光谱范围。关于测量步骤的更多信息,请参见辐照度《应用指南》。

Neo
辐射 [W/m²/sr] 透镜
辐照度 [W/m²] 余弦校正器*
辐射强度 [W/sr] 余弦校正器*
低亮度 yes

* 除了余弦校正器,积分球还可用于确定[光谱]辐照度和辐射强度/照度和发光强度。

How are you measuring?


With fibers and other accessories even more type of measurements are possible. Often used accessories are integrating spheres, cuvettes for fluids, light sources or filter holders.

Consumers are used to enjoy top-quality displays in their mobile phones, tablets, laptops and even cars. Emerging technologies such as lighting surfaces for office and home illumination are expected to look equally perfect. Both displays and luminous surfaces are the main application areas for imaging colorimeters.